33rd IEEE International Conference on Microelectronic Test Structures (ICMTS).

Location: 

South Hall, Pollock Halls, Edinburgh.

Date: 

Monday, April 6, 2020 - 09:00 to Thursday, April 9, 2020 - 16:00

The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The meeting is a IEEE conference, sponsored by the IEEE Electron Devices Society.

The conference will be held from 6 to 9 April 2020, at the University of Edinburgh. Please see ICMTS webite for more details. 

 

For more information on ICMTS including information on past conferences, please visit the permanent ICMTS website.

Book your Conference tickets now. 

Book your Accommodation now. 

 

 

 

Refund: For information on refunding your accommodation please see your booking confirmation. For information on refunding your conference tickets please see the releasing rate table below. Contact: icmts@ed.ac.uk

 

 Your Arrival Date:

 06/04/2020

 Reduction/Cancellation Periods

 Date Range

 Rate

 Start Date

 End Date

Up to 181 days from arrival

0%

On and Before

08/10/2019

180-121 days

10%

9/10/2019

07/12/2019

120-91 days

15%

08/12/2019

06/01/2020

90-61 days

25%

07/01/2020

05/02/2020

60-31 days

50%

06/02/2020

06/03/2020

30 days and under

100%

07/03/2020

Arrival.

Event Contact Name: 

Event Contact Email: