A new EverBeing EB-6 Analytical Probestation has been installed at the SMC thanks to a collaboration with EverBeing Int'l Corp.
The manual probestation is capable of low-voltage and low-current DC measurements on wafers up to 200mm diameter. The prober is connected to a Keithley 4200-SCS Semiconductor Parameter Analyzer system funded by the Centre for Doctoral Training in Intelligent Sensing and Measurement.
The first results obtained using the prober were presented at the 2017 IEEE International Conference on Microelectronic Test Structures in March and will be published on IEEE Xplore soon.
The equipment is available for use by Engineering students and researchers, as well as for outside users on arrangement.